New Approach for Sweep Frequency Test Record
2984
Niimi, T.; Ando, S.; Owaki, I.; Nakamura, S.
Victor Company of Japan, Ltd., Record Manufacturing Division, Audio Engineering Research Center, Maspeth, NY
May 1978
Convention Paper
Free to AES members & instutions and $33 to non-members
Measurement of Recorded Level and Channel Separation on Phonograph Discs Using Optical Interferometry Techniques
2727
Inoue, T.; Owaki, I.; Ohba, K.; Nakamura, S.; Eargle, John
Victor Company of Japan, Tokyo, Japan ; JME Associates, Los Angeles, CA
November 1974
Journal Article
Free to AES members & instutions and $33 to non-members
Improvements in Cutting Styli for CD-4 Discs
2433
Inoue, T.; Owaki, I.; Totsuka, K.; Nakamura, S.; Eargle, J.
Victor Company of Japan, Tokyo, Japan ; JME Associates, Los Angeles, CA
March 1975
Convention Paper
Free to AES members & instutions and $33 to non-members
Improvements in Cutting Styli for CD-4 Discs
2662
Inoue, T.; Owaki, I.; Totsuka, K.; Nakamura, S.; Eargle, J.
Victor Company of Japan, Tokyo, Japan ; JME Associates, Los Angeles, CA
October 1975
Journal Article
Free to AES members & instutions and $33 to non-members
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