New Approach for Sweep Frequency Test Record

Niimi T, Ando S, Owaki I, Nakamura S. New Approach for Sweep Frequency Test Record. In: AES Convention 60. Audio Engineering Society; 1978. Paper 1370. Available from: https://aes.org/publications/elibrary-page/?id=2984

@inproceedings{Niimi1978_2984,
  author = {Niimi, T. and Ando, S. and Owaki, I. and Nakamura, S.},
  title = {{New Approach for Sweep Frequency Test Record}},
  booktitle = {AES Convention 60},
  note = {Paper 1370},
  year = {1978},
  month = may,
  publisher = {Audio Engineering Society},
  url = {https://aes.org/publications/elibrary-page/?id=2984}
}

TY  - CPAPER
TI  - New Approach for Sweep Frequency Test Record
AU  - Niimi, T.
AU  - Ando, S.
AU  - Owaki, I.
AU  - Nakamura, S.
T2  - AES Convention 60
M1  - Paper 1370
PY  - 1978
DA  - 1978/05/06
UR  - https://aes.org/publications/elibrary-page/?id=2984
PB  - Audio Engineering Society
LA  - en
AB  - A low cross-talk precision sweep frequency test record is mastered by the half-speed cutting system, which uses an advance-ball and the technique of synchronizing frequency sweep speed with platter revolution. The amplitude is calibrated by the interferometry method. The resulting test record has specifications of frequency response, 20 Hz to 20kHz + 0.5 dB; separation over 25 dB below 50 Hz and above 10kHz; and separation over 35 dB in the mid-range.
ER  -