A New Method for Measuring Distortion using a Multitone Stimulus and Non-Coherence

Authors: Brunet, Pascal; Temme, Steve

Affiliation: Listen, Inc

Publication Date: October 2006

Type: Convention Paper

Cost: Free to AES members & institutions and $33 to non-members

A New Method for Measuring Distortion Using a Multitone Stimulus and Noncoherence

Authors: Temme, Steve; Brunet, Pascal

Affiliation: Listen, Inc., Boston, MA 02118, USA

Publication Date: March 2008

Type: Journal Article

Cost: Free to AES members & institutions and $33 to non-members

Headphone Response: Target Equalization Trade-offs and Limitations

Authors: Struck, Christopher; Temme, Steve

Affiliation: CJS Labs, San Francisco, CA, USA; Acoustical Society of America, Melville, NY, USA; Listen, Inc., Boston, MA, USA

Publication Date: October 2015

Type: Convention Paper

Cost: Free to AES members & institutions and $33 to non-members

In-Vehicle Audio System Distortion Audibility versus Level and Its Impact on Perceived Sound Quality

Authors: Temme, Steve; Dennis, Patrick

Affiliation: Listen, Inc., Boston, MA, USA; Nissan Technical Center North America, Farmington Hills, MI, USA

Publication Date: September 2016

Type: Convention Paper

Cost: Free to AES members & institutions and $33 to non-members

A New THD+N Algorithm for Measuring Today's High Resolution Audio Systems

Authors: Roney, Alfred; Temme, Steve

Affiliation: MathWorks, Inc., Natick, MA, USA; Listen, Inc., Boston, MA, USA

Publication Date: October 2017

Type: Convention Paper

Cost: Free to AES members & institutions and $33 to non-members

Simulated Free Field Measurements

Authors: Struck, Christopher J.; Temme, Steve F.

Affiliation: Bruel & Kjaer, Naerum, Denmark

Publication Date: October 1992

Type: Convention Paper

Cost: Free to AES members & institutions and $33 to non-members

A New Method for Transient Distortion Detection

Authors: Temme, Steve; Shakya, Rahul; Datta, Jayant

Affiliation: Listen, Inc.; Listen, Inc.; none

Publication Date: October 2023

Type: Express Paper

Cost: Free to AES members & institutions and $33 to non-members

Simulated Free Field Measurements

Authors: Struck, Christopher J.; Temme, Steve F.

Affiliation: Bruel & Kjaer, Naerum, Denmark

Publication Date: June 1994

Type: Journal Article

Cost: Free to AES members & institutions and $33 to non-members

The Challenges of Testing MP3 Players

Authors: Brunet, Pascal; Rimkunas, Zachary; Temme, Steve

Affiliation: Listen, Inc.

Publication Date: May 2007

Type: Convention Paper

Cost: Free to AES members & institutions and $33 to non-members

Practical Implementation of Perceptual Rub & Buzz Distortion and Experimental Results

Authors: Brunet, Pascal; Fallon, Brian; Temme, Steve

Affiliation: Listen, Inc., Boston, MA, USA

Publication Date: November 2010

Type: Convention Paper

Cost: Free to AES members & institutions and $33 to non-members