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Author

Simulated Diffuse Field Measurements

Authors: Struck, Christopher J.
Affiliation: ReSound Corporation, Redwood City, CA
Publication Date: September 1999
Type: Convention Paper
Cost: Free to AES members & institutions and $33 to non-members

Simulated Free Field Measurements

Authors: Struck, Christopher J.; Temme, Steve F.
Affiliation: Bruel & Kjaer, Naerum, Denmark
Publication Date: October 1992
Type: Convention Paper
Cost: Free to AES members & institutions and $33 to non-members