Determination of the Thiele-Small Parameters Using Two-Channel FFT Analysis

Struck CJ. Determination of the Thiele-Small Parameters Using Two-Channel FFT Analysis. In: AES Convention 82. Audio Engineering Society; 1987. Paper 2446. Available from: https://aes.org/publications/elibrary-page/?id=4983

@inproceedings{Struck1987_4983,
  author = {Struck, Christopher J.},
  title = {{Determination of the Thiele-Small Parameters Using Two-Channel FFT Analysis}},
  booktitle = {AES Convention 82},
  note = {Paper 2446},
  year = {1987},
  month = mar,
  publisher = {Audio Engineering Society},
  url = {https://aes.org/publications/elibrary-page/?id=4983}
}

TY  - CPAPER
TI  - Determination of the Thiele-Small Parameters Using Two-Channel FFT Analysis
AU  - Struck, Christopher J.
T2  - AES Convention 82
M1  - Paper 2446
PY  - 1987
DA  - 1987/03/06
UR  - https://aes.org/publications/elibrary-page/?id=4983
PB  - Audio Engineering Society
LA  - en
AB  - The low-frequency performance of a driverfor use in a direct-radiator loudspeaker system is characterized by its Thiele-Small parameters. Two impedance measurements are required for the calculation of these parameters. A fast technique for performing the impedance measurements is presented and the calculation of the basic parameters is reviewed. Computer implementation for numerical calculation and control of the analyzer is discussed and the results for a typical driver are shown.
ER  -