Authors - AES

New Approach for Sweep Frequency Test Record

Authors: Niimi, T.; Ando, S.; Owaki, I.; Nakamura, S.

Affiliation: Victor Company of Japan, Ltd., Record Manufacturing Division, Audio Engineering Research Center, Maspeth, NY

Publication Date: May 1978

Type: Convention Paper

Cost: Free to AES members & institutions and $33 to non-members

Authors: Inoue, T.; Owaki, I.; Ohba, K.; Nakamura, S.; Eargle, John

Affiliation: Victor Company of Japan, Tokyo, Japan ; JME Associates, Los Angeles, CA

Publication Date: November 1974

Type: Journal Article

Cost: Free to AES members & institutions and $33 to non-members

Authors: Inoue, T.; Owaki, I.; Totsuka, K.; Nakamura, S.; Eargle, J.

Affiliation: Victor Company of Japan, Tokyo, Japan ; JME Associates, Los Angeles, CA

Publication Date: March 1975

Type: Convention Paper

Cost: Free to AES members & institutions and $33 to non-members

Authors: Inoue, T.; Owaki, I.; Totsuka, K.; Nakamura, S.; Eargle, J.

Affiliation: Victor Company of Japan, Tokyo, Japan ; JME Associates, Los Angeles, CA

Publication Date: October 1975

Type: Journal Article

Cost: Free to AES members & institutions and $33 to non-members