TDFD-Based Measurement of Analog-to-Digital Converter Nonlinearity

Rathmell J, Scott J, Parker A. TDFD-Based Measurement of Analog-to-Digital Converter Nonlinearity. J Audio Eng Soc. 1997;45(10):832-840. Available from: https://aes.org/publications/elibrary-page/?id=7838

@article{Rathmell1997_7838,
  author = {Rathmell, James and Scott, Jonathan and Parker, Anthony},
  title = {{TDFD-Based Measurement of Analog-to-Digital Converter Nonlinearity}},
  journal = {Journal of the Audio Engineering Society},
  volume = {45},
  number = {10},
  pages = {832--840},
  year = {1997},
  month = oct,
  publisher = {Audio Engineering Society},
  url = {https://aes.org/publications/elibrary-page/?id=7838}
}

TY  - JOUR
TI  - TDFD-Based Measurement of Analog-to-Digital Converter Nonlinearity
AU  - Rathmell, James
AU  - Scott, Jonathan
AU  - Parker, Anthony
T2  - Journal of the Audio Engineering Society
J2  - J. Audio Eng. Soc.
VL  - 45
IS  - 10
SP  - 832
EP  - 840
PY  - 1997
DA  - 1997/10/06
UR  - https://aes.org/publications/elibrary-page/?id=7838
PB  - Audio Engineering Society
LA  - en
AB  - Analog-to-digital converters (ADCs) are central to modern audio, video, and RF systems, with some modern converters providing 23 plus -significant- bits. With such systems, performance is usually limited to audible distortion. Consequently linearity tests, analogous to distortion measurements, are adapted to test performance. The total difference-frequency distortion (TDFD) test is a modern standard for distortion measurement in the audio field, and its uniquely powerful advantages may be transferred to the realm of ADC testing. Building on existing work, a straightforward TDFD test for ADC systems is described and demonstrated. Measurements of example ADC systems are presented. A simple relationship between distortion and effective bits is derived, as a measure of performance, and testing guidelines are given.
ER  -