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TDFT-Based Measurement of Analog-to-Digital Converter Nonlinearity

Authors: Scott, Jonathan; Rathmell, James
Affiliation: Dept. of Electrical Engineering, University of Sydney, NSW ; Dept. of Electronics, Macquarie University, NSW
Publication Date: August 1996
Type: Convention Paper
Cost: Free to AES members & institutions and $33 to non-members

TDFD-Based Measurement of Analog-to-Digital Converter Nonlinearity

Authors: Rathmell, James; Scott, Jonathan; Parker, Anthony
Affiliation: Department of Electrical Engineering, University of Sydney, Sydney, Australia ; Department of Electronics, Macquarie University, Sydney, Australia
Publication Date: October 1997
Type: Journal Article
Cost: Free to AES members & institutions and $33 to non-members