A New Technique for Fast Response Measurements Using Linear Swept Sine Excitation

Struck CJ, Biering CH. A New Technique for Fast Response Measurements Using Linear Swept Sine Excitation. In: AES Convention 90. Audio Engineering Society; 1991. Paper 3038. Available from: https://aes.org/publications/elibrary-page/?id=5655

@inproceedings{Struck1991_5655,
  author = {Struck, Christopher J. and Biering, C. Henrik},
  title = {{A New Technique for Fast Response Measurements Using Linear Swept Sine Excitation}},
  booktitle = {AES Convention 90},
  note = {Paper 3038},
  year = {1991},
  month = feb,
  publisher = {Audio Engineering Society},
  url = {https://aes.org/publications/elibrary-page/?id=5655}
}

TY  - CPAPER
TI  - A New Technique for Fast Response Measurements Using Linear Swept Sine Excitation
AU  - Struck, Christopher J.
AU  - Biering, C. Henrik
T2  - AES Convention 90
M1  - Paper 3038
PY  - 1991
DA  - 1991/02/06
UR  - https://aes.org/publications/elibrary-page/?id=5655
PB  - Audio Engineering Society
LA  - en
AB  - Response measurements performed using Time Delay Spectrometry utilize a linearly swept sinusoidal excitation signal. Increasing the sweep rate in TDS can result in serious errors in the measured response. A new measurement technique is introduced which allows faster sweep rates to be used than with traditional TDS measurements. This technique enables the correct measurement of the complex time-selective frequency response as well as providing flexibility in the application of windowing functions.
ER  -