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Analog-to-digital converters (ADCs) are central to modern audio, video, and RF systems, with some modern converters providing 23 plus -significant- bits. With such systems, performance is usually limited to audible distortion. Consequently linearity tests, analogous to distortion measurements, are adapted to test performance. The total difference-frequency distortion (TDFD) test is a modern standard for distortion measurement in the audio field, and its uniquely powerful advantages may be transferred to the realm of ADC testing. Building on existing work, a straightforward TDFD test for ADC systems is described and demonstrated. Measurements of example ADC systems are presented. A simple relationship between distortion and effective bits is derived, as a measure of performance, and testing guidelines are given.
Author (s): Rathmell, James;
Scott, Jonathan;
Parker, Anthony;
Affiliation:
Department of Electrical Engineering, University of Sydney, Sydney, Australia ; Department of Electronics, Macquarie University, Sydney, Australia
(See document for exact affiliation information.)
Publication Date:
1997-10-06
DOI:
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Rathmell, James; Scott, Jonathan; Parker, Anthony; 1997; TDFD-Based Measurement of Analog-to-Digital Converter Nonlinearity [PDF]; Department of Electrical Engineering, University of Sydney, Sydney, Australia ; Department of Electronics, Macquarie University, Sydney, Australia; Paper ; Available from: https://aes.org/publications/elibrary-page/?id=7838
Rathmell, James; Scott, Jonathan; Parker, Anthony; TDFD-Based Measurement of Analog-to-Digital Converter Nonlinearity [PDF]; Department of Electrical Engineering, University of Sydney, Sydney, Australia ; Department of Electronics, Macquarie University, Sydney, Australia; Paper ; 1997 Available: https://aes.org/publications/elibrary-page/?id=7838
@article{Rathmell1997tdfd-based,
title={{TDFD-Based Measurement of Analog-to-Digital Converter Nonlinearity}},
author={Rathmell, James and Scott, Jonathan and Parker, Anthony},
year={1997},
month={oct},
journal={Journal of the Audio Engineering Society},
volume={45},
number={10},
pages={832-840},
}
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