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TDFT-Based Measurement of Analog-to-Digital Converter Nonlinearity

Author (s): Scott, Jonathan; Rathmell, James

Affliation: Dept. of Electrical Engineering, University of Sydney, NSW ; Dept. of Electronics, Macquarie University, NSW

Publication Date: August 1996

Type: Convention Paper

Cost: Free to AES members & instutions and $33 to non-members

TDFD-Based Measurement of Analog-to-Digital Converter Nonlinearity

Author (s): Rathmell, James; Scott, Jonathan; Parker, Anthony

Affliation: Department of Electrical Engineering, University of Sydney, Sydney, Australia ; Department of Electronics, Macquarie University, Sydney, Australia

Publication Date: October 1997

Type: Journal Article

Cost: Free to AES members & instutions and $33 to non-members

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Author: rathmell-james

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