J. Cozens, M. Hämäläinen, and M. Pekkarinen, “IMPro -- Method for Integrated Microphone Pressure Frequency Response Measurement Using a Probe Microphone,” in Proc. Convention Paper, May 2025, pp. 10225:1-12. [Online]. Available: https://aes.org/publications/elibrary-page/?id=22907
Cozens J, Hämäläinen M, Pekkarinen M. IMPro -- Method for Integrated Microphone Pressure Frequency Response Measurement Using a Probe Microphone. In: Convention Paper. Audio Engineering Society; 2025.pp. 10225:1-12. Available from: https://aes.org/publications/elibrary-page/?id=22907
@inproceedings{Cozens2025_22907,
author = {Cozens, John and Hämäläinen, Matti and Pekkarinen, Mikko},
title = {{IMPro -- Method for Integrated Microphone Pressure Frequency Response Measurement Using a Probe Microphone}},
pages = {10225:1-12},
url = {https://aes.org/publications/elibrary-page/?id=22907},
year = {2025},
month = may,
publisher = {Audio Engineering Society},
address = {Warsaw Poland}
}
TY - CPAPER
TI - IMPro -- Method for Integrated Microphone Pressure Frequency Response Measurement Using a Probe Microphone
AU - Cozens, John
AU - Hämäläinen, Matti
AU - Pekkarinen, Mikko
SP - 1
EP - 12
M1 - Paper 10225
PY - 2025
DA - 2025/05/12
UR - https://aes.org/publications/elibrary-page/?id=22907
PB - Audio Engineering Society
CY - Warsaw Poland
LA - en
AB - We propose a practical method for the measurement of the pressure sensitivity frequency response of a microphone that has been integrated into product mechanics. The method uses a probe microphone to do determine the sound pressure entering the inlet of the integrated microphone. We show that the measurements can be performed in a normal office environment as well as in anechoic conditions. The method is validated with measurement of a rigid spherical microphone prototype having analytically defined scattering characteristics. Our results indicate that the proposed method, called IMPro, can effectively measure the pressure sensitivity frequency response of microphones in commercial products, quite independent of the measurement environment.
ER -