Authors - AES

Test Signals for Measuring the Efficiency of Audio Amplifiers

Authors: van der Zee, R. A. R.; van Tuijl, A. J. M

Affiliation: MESA Research institute University of Twente, Enschede, The Netherlands ; Philips Semiconductors, Nijmegen, The Netherlands

Publication Date: May 1998

Type: Convention Paper

Cost: Free to AES members & institutions and $33 to non-members

Authors: van der Zee, R. A. R.; van Tuijl, A. J. M.

Affiliation: MESA Research Institutew University of Twentew Enschede, The Netherlands ; Philips Semiconductors, Nijmegen, The Netherlands

Publication Date: September 1998

Type: Convention Paper

Cost: Free to AES members & institutions and $33 to non-members

Authors: van der Zee, R. A. R.; van Tuijl, A. J. M.

Affiliation: MESA Research Institute, University of Twente, Enschede, The Netherlands ; Philips Semiconductors, Nijmegen, The Netherlands

Publication Date: September 1997

Type: Convention Paper

Cost: Free to AES members & institutions and $33 to non-members