Measurement of Small Time Constants of Thermal Impedance of Bipolar Transistors with an Audio Analyzer

Latzel TK, Gottwald AJ. Measurement of Small Time Constants of Thermal Impedance of Bipolar Transistors with an Audio Analyzer. In: AES Convention 98. Audio Engineering Society; 1995.pp. 3968:1-10. Available from: https://aes.org/publications/elibrary-page/?id=7798

@inproceedings{Latzel1995_7798,
  author = {Latzel, Thomas K. and Gottwald, Alfons J.},
  title = {{Measurement of Small Time Constants of Thermal Impedance of Bipolar Transistors with an Audio Analyzer}},
  booktitle = {AES Convention 98},
  pages = {3968:1-10},
  url = {https://aes.org/publications/elibrary-page/?id=7798},
  year = {1995},
  month = feb,
  publisher = {Audio Engineering Society}
}

TY  - CPAPER
TI  - Measurement of Small Time Constants of Thermal Impedance of Bipolar Transistors with an Audio Analyzer
AU  - Latzel, Thomas K.
AU  - Gottwald, Alfons J.
T2  - AES Convention 98
SP  - 1
EP  - 10
M1  - Paper 3968
PY  - 1995
DA  - 1995/02/06
UR  - https://aes.org/publications/elibrary-page/?id=7798
PB  - Audio Engineering Society
LA  - en
AB  - For the estimation and the simulation of linear and nonlinear distortions caused by thermally effected power-dependent internal feedback (TPF), the thermal impedance has to be measured. Conventional measurements refer to the time domain; they analyze the response to switched changes of power dissipation. This paper proposes measurements in the frequency domain with the advantage that an audio analyzer can be employed.
ER  -