Opens in a new tab

AES E-Library

← Back to search

Convention Paper

Techniques to Measure and Maximize the Performance of a 120 dB, 24-Bit, 96-kHz A/D Converter Integrated Circuit

Authors: Harris, Steven; Green, Steven; Leung, Ka

AES Convention 103 · Paper 4530 · September 1997

Abstract

In order to realize maximum performance from an A/D converter chip, many subtleties must be addressed in the external environment in order to make sure that the performance is not degraded. This paper briefly describes the architecture of an example A/D converter, discusses some trade-offs in the external circuit design, and concludes with some measurement issues and results. The techniques discussed also form a basis for users' own designs, allowing predictable realization of maximum performance.

Details

Published in
AES Convention 103
AES Convention
103
Paper number
4530
Publication date
September 6, 1997
Session subject
Signal Processing and Conversion
Affiliation
Crystal Semiconductor Corporation, Austin, TX (See document for exact affiliation information.)
Type
Convention Paper