Generating Production Test Limits Based on Software Derived Monte Carlo Analysis

Jeffs R, Cook D. Generating Production Test Limits Based on Software Derived Monte Carlo Analysis. In: AES Conference: 11th International Conference: Test & Measurement. Audio Engineering Society; 1992. Paper 11-008. Available from: https://aes.org/publications/elibrary-page/?id=6288

@inproceedings{Jeffs1992_6288,
  author = {Jeffs, Rick and Cook, Devin},
  title = {{Generating Production Test Limits Based on Software Derived Monte Carlo Analysis}},
  booktitle = {AES Conference: 11th International Conference: Test \& Measurement},
  note = {Paper 11-008},
  year = {1992},
  month = may,
  publisher = {Audio Engineering Society},
  url = {https://aes.org/publications/elibrary-page/?id=6288}
}

TY  - CPAPER
TI  - Generating Production Test Limits Based on Software Derived Monte Carlo Analysis
AU  - Jeffs, Rick
AU  - Cook, Devin
T2  - AES Conference: 11th International Conference: Test & Measurement
M1  - Paper 11-008
PY  - 1992
DA  - 1992/05/06
UR  - https://aes.org/publications/elibrary-page/?id=6288
PB  - Audio Engineering Society
LA  - en
AB  - This paper discusses the generation of production test limits from circuit analysis software utilizing Monte Carlo techniques. The general process of converting data from PSpice- and Micro-Cap III- is described. A specific example of directly converting data from PSpice Monte Carlo analysis into Audio Precision System One- test limits is shown.
ER  -