Measurement Techniques for Debugging ADC and DAC Systems

Harris S. Measurement Techniques for Debugging ADC and DAC Systems. In: AES Conference: 11th International Conference: Test & Measurement. Audio Engineering Society; 1992. Paper 11-010. Available from: https://aes.org/publications/elibrary-page/?id=6286

@inproceedings{Harris1992_6286,
  author = {Harris, Steven},
  title = {{Measurement Techniques for Debugging ADC and DAC Systems}},
  booktitle = {AES Conference: 11th International Conference: Test \& Measurement},
  note = {Paper 11-010},
  year = {1992},
  month = may,
  publisher = {Audio Engineering Society},
  url = {https://aes.org/publications/elibrary-page/?id=6286}
}

TY  - CPAPER
TI  - Measurement Techniques for Debugging ADC and DAC Systems
AU  - Harris, Steven
T2  - AES Conference: 11th International Conference: Test & Measurement
M1  - Paper 11-010
PY  - 1992
DA  - 1992/05/06
UR  - https://aes.org/publications/elibrary-page/?id=6286
PB  - Audio Engineering Society
LA  - en
AB  - Modern ADCs and DACs are capable of achieving ever higher levels of performance. Confirming the achievement of the best possible performance involves the use of various test techniques. Having found some performance shortcomings, various test techniques are described which aid in the diagnosis of the cause. These include clock jitter measurement techniques, and the use of DC offset injection.
ER  -