D. Jensen and G. Sokolich, “Spectral Contamination Measurement,” in Proc. AES Convention 85, Nov. 1988, Paper 2725. [Online]. Available: https://aes.org/publications/elibrary-page/?id=4719
Jensen D, Sokolich G. Spectral Contamination Measurement. In: AES Convention 85. Audio Engineering Society; 1988. Paper 2725. Available from: https://aes.org/publications/elibrary-page/?id=4719
@inproceedings{Jensen1988_4719,
author = {Jensen, Deane and Sokolich, Gary},
title = {{Spectral Contamination Measurement}},
booktitle = {AES Convention 85},
note = {Paper 2725},
year = {1988},
month = nov,
publisher = {Audio Engineering Society},
url = {https://aes.org/publications/elibrary-page/?id=4719}
}
TY - CPAPER
TI - Spectral Contamination Measurement
AU - Jensen, Deane
AU - Sokolich, Gary
T2 - AES Convention 85
M1 - Paper 2725
PY - 1988
DA - 1988/11/06
UR - https://aes.org/publications/elibrary-page/?id=4719
PB - Audio Engineering Society
LA - en
AB - The "spectral contamination" measurement is a graphic spectrum analysis of cross modulation products produced in a nonlinear (any real-world) amplifier or system which is excited by a multi-frequency signal. The system under test is excited at defined frequencies and the resulting nonlinear distortion products are analyzed at other frequencies where no excitation energy is present. It is our hope that this method of measurement will ultimately enable us to correlate objective measurement results with subjective impressions of audio components, a goal which has eluded many traditional distortion measurements.
ER -