J. A. Siciliano, “How to Give Your Woofer a Lie Detector Test,” in Proc. AES Convention 60, May 1978, pp. 1368:1-16. [Online]. Available: https://aes.org/publications/elibrary-page/?id=2986
Siciliano JA. How to Give Your Woofer a Lie Detector Test. In: AES Convention 60. Audio Engineering Society; 1978.pp. 1368:1-16. Available from: https://aes.org/publications/elibrary-page/?id=2986
@inproceedings{Siciliano1978_2986,
author = {Siciliano, Jerry A.},
title = {{How to Give Your Woofer a Lie Detector Test}},
booktitle = {AES Convention 60},
pages = {1368:1-16},
url = {https://aes.org/publications/elibrary-page/?id=2986},
year = {1978},
month = may,
publisher = {Audio Engineering Society}
}
TY - CPAPER
TI - How to Give Your Woofer a Lie Detector Test
AU - Siciliano, Jerry A.
T2 - AES Convention 60
SP - 1
EP - 16
M1 - Paper 1368
PY - 1978
DA - 1978/05/06
UR - https://aes.org/publications/elibrary-page/?id=2986
PB - Audio Engineering Society
LA - en
AB - The theoretical model for a low frequency driver assumes linearity. The reality of the matter is, however, that woofers are non-linear devices. Consequently measurement of the driver's ideal (linear) parameters can be exceedingly difficult. This paper will discuss techniques which isolate individual parameters. Without the inhibition of cumulative errors (from the non-linearities of other parameters) the perturbation, as a function of excursion, of each parameter can be examined. The concepts discussed will include analysis and measurement of driver parameters in a vacuum.
ER -