Extended Application of T.I.M. Test Procedures

Skritek P, Pichler H. Extended Application of T.I.M. Test Procedures. In: AES Convention 64. Audio Engineering Society; 1979. Paper 1557. Available from: https://aes.org/publications/elibrary-page/?id=2797

@inproceedings{Skritek1979_2797,
  author = {Skritek, Paul and Pichler, Heinrich},
  title = {{Extended Application of T.I.M. Test Procedures}},
  booktitle = {AES Convention 64},
  note = {Paper 1557},
  year = {1979},
  month = nov,
  publisher = {Audio Engineering Society},
  url = {https://aes.org/publications/elibrary-page/?id=2797}
}

TY  - CPAPER
TI  - Extended Application of T.I.M. Test Procedures
AU  - Skritek, Paul
AU  - Pichler, Heinrich
T2  - AES Convention 64
M1  - Paper 1557
PY  - 1979
DA  - 1979/11/06
UR  - https://aes.org/publications/elibrary-page/?id=2797
PB  - Audio Engineering Society
LA  - en
AB  - TIM test procedures are reviewed and new test signal combinations introduced. Their application, especially to recording devices, transmission links, and electromechanical transducers id described, providing comparable dynamic nonlinear distortion figures of all components in audio systems. For loudspeakers, for example, the results can be used for exact specification of power handling capability, especially of tweeters. Relaxation phenomena in the acoustic output arising from increase of voice-coil temperature in tweeters are described.
ER  -