Proposed AES Test Standard for Specifying Continuous and Short-Term Maximum Power and SPL for Electronic and Electro-Acoustic Systems: Part 1

Keele J,DB(, Hutt S, Kay M, Sarvis H. Proposed AES Test Standard for Specifying Continuous and Short-Term Maximum Power and SPL for Electronic and Electro-Acoustic Systems: Part 1. In: AES Convention 144. Audio Engineering Society; 2018. Paper 427. Available from: https://aes.org/publications/elibrary-page/?id=19540

@inproceedings{Keele2018_19540,
  author = {Keele, Jr., D. B. (Don) and Hutt, Steven and Kay, Marshall and Sarvis, Hugh},
  title = {{Proposed AES Test Standard for Specifying Continuous and Short-Term Maximum Power and SPL for Electronic and Electro-Acoustic Systems: Part 1}},
  booktitle = {AES Convention 144},
  note = {Paper 427},
  year = {2018},
  month = may,
  publisher = {Audio Engineering Society},
  url = {https://aes.org/publications/elibrary-page/?id=19540}
}

TY  - CPAPER
TI  - Proposed AES Test Standard for Specifying Continuous and Short-Term Maximum Power and SPL for Electronic and Electro-Acoustic Systems: Part 1
AU  - Keele, Jr., D. B. (Don)
AU  - Hutt, Steven
AU  - Kay, Marshall
AU  - Sarvis, Hugh
T2  - AES Convention 144
M1  - Paper 427
PY  - 2018
DA  - 2018/05/06
UR  - https://aes.org/publications/elibrary-page/?id=19540
PB  - Audio Engineering Society
LA  - en
AB  - This paper describes a proposed test method that allows both the continuous and short-term maximum peak output and SPL for electronic and electroacoustic systems to be measured. Systems such as power amplifiers, loudspeakers, and sound reinforcement/cinema systems can be measured and specified over the complete audible range. The test is divided into two parts that individually assesses: (1) the system’s broadband continuous maximum output using various steady-state low-crest-factor test signals and (2) the system’s short-term narrow-band maximum output using high-crest-factor test signals. The combination of both tests completely specifies the system’s maximum output on a continuous and short-term narrow-band basis. A future Part 2 paper will go into detail concerning the tests and will illustrate with measured test results.
ER  -