J. ,. D. B. (. Keele, M. Kay, and H. Sarvis, “Short-Term Peak Power and Maximum SPL Testing of Electronic and Electro-Acoustic Systems Using Octave-Bandwidth Tone Bursts,” in Proc. AES Conference: 2018 AES@NAMM Pro Sound Symposium, Jan. 2018, Paper 5. [Online]. Available: https://aes.org/publications/elibrary-page/?id=19371
Keele J,DB(, Kay M, Sarvis H. Short-Term Peak Power and Maximum SPL Testing of Electronic and Electro-Acoustic Systems Using Octave-Bandwidth Tone Bursts. In: AES Conference: 2018 AES@NAMM Pro Sound Symposium. Audio Engineering Society; 2018. Paper 5. Available from: https://aes.org/publications/elibrary-page/?id=19371
@inproceedings{Keele2018_19371,
author = {Keele, Jr., D. B. (Don) and Kay, Marshall and Sarvis, Hugh},
title = {{Short-Term Peak Power and Maximum SPL Testing of Electronic and Electro-Acoustic Systems Using Octave-Bandwidth Tone Bursts}},
booktitle = {AES Conference: 2018 AES@NAMM Pro Sound Symposium},
note = {Paper 5},
year = {2018},
month = jan,
publisher = {Audio Engineering Society},
url = {https://aes.org/publications/elibrary-page/?id=19371}
}
TY - CPAPER
TI - Short-Term Peak Power and Maximum SPL Testing of Electronic and Electro-Acoustic Systems Using Octave-Bandwidth Tone Bursts
AU - Keele, Jr., D. B. (Don)
AU - Kay, Marshall
AU - Sarvis, Hugh
T2 - AES Conference: 2018 AES@NAMM Pro Sound Symposium
M1 - Paper 5
PY - 2018
DA - 2018/01/06
UR - https://aes.org/publications/elibrary-page/?id=19371
PB - Audio Engineering Society
LA - en
AB - This paper describes an easily-run test that allows the short-term peak power and maximum SPL capabilities of amplifiers, electronic systems, loudspeakers, and sound reinforcement systems to be evaluated over the complete audio range. It is based on the use of a series of eleven octave-bandwidth tone-burst wave files at standard octave-center frequencies of 16 Hz to 16 kHz. The tone burst wave-shapes are very similar to those found in typical music program material. For a specific peak power or peak SPL frequency-response test, each tone burst is sequentially applied to the device under test and the maximum output is assessed at each frequency either subjectively or objectively. This differs from the author’s past work on the same topic that essentially accomplished the same test using a series of 31 third-octave bandwidth tone bursts. This new proposed test method uses far-fewer tone bursts and as a result the test is much easier and quicker to accomplish.
ER -