A Headphone Measurement System Covers both Audible Frequency and beyond 20 kHz (Part 3)

Tsunoda N, Hara T, Nageno K. A Headphone Measurement System Covers both Audible Frequency and beyond 20 kHz (Part 3). In: AES Convention 143. Audio Engineering Society; 2017. Paper 9873. Available from: https://aes.org/publications/elibrary-page/?id=19270

@inproceedings{Tsunoda2017_19270,
  author = {Tsunoda, Naotaka and Hara, Takeshi and Nageno, Koji},
  title = {{A Headphone Measurement System Covers both Audible Frequency and beyond 20 kHz (Part 3)}},
  booktitle = {AES Convention 143},
  note = {Paper 9873},
  year = {2017},
  month = oct,
  publisher = {Audio Engineering Society},
  url = {https://aes.org/publications/elibrary-page/?id=19270}
}

TY  - CPAPER
TI  - A Headphone Measurement System Covers both Audible Frequency and beyond 20 kHz (Part 3)
AU  - Tsunoda, Naotaka
AU  - Hara, Takeshi
AU  - Nageno, Koji
T2  - AES Convention 143
M1  - Paper 9873
PY  - 2017
DA  - 2017/10/06
UR  - https://aes.org/publications/elibrary-page/?id=19270
PB  - Audio Engineering Society
LA  - en
AB  - New headphone frequency response measuring scheme was standardized as JEITA RC-8140B-1 in March 2016. The basic idea of the scheme is that the frequency response is to be measured by HATS and compensated by a free-field HRTF of HATS used in the measurement. One of the advantages of this measuring scheme is that obtained results have equivalent implication with the results of free-field frequency response of the loudspeakers. This report supplements the previous report that proposed the basic idea of above-mentioned scheme by adding topics regarding newly developed HATS to improve signal to noise ratio in high frequency areas above 20 kHz with ear simulators.
ER  -