Period Deviation Tolerance Templates: A Novel Approach to Evaluation and Specification of Self-Synchronizing Audio Converters

Legray F, Heeb T, Genevey S, Kuo H. Period Deviation Tolerance Templates: A Novel Approach to Evaluation and Specification of Self-Synchronizing Audio Converters. In: AES Convention 133. Audio Engineering Society; 2012. Paper 8729. Available from: https://aes.org/publications/elibrary-page/?id=16471

@inproceedings{Legray2012_16471,
  author = {Legray, Francis and Heeb, Thierry and Genevey, Sebastien and Kuo, Hugo},
  title = {{Period Deviation Tolerance Templates: A Novel Approach to Evaluation and Specification of Self-Synchronizing Audio Converters}},
  booktitle = {AES Convention 133},
  note = {Paper 8729},
  year = {2012},
  month = oct,
  publisher = {Audio Engineering Society},
  url = {https://aes.org/publications/elibrary-page/?id=16471}
}

TY  - CPAPER
TI  - Period Deviation Tolerance Templates: A Novel Approach to Evaluation and Specification of Self-Synchronizing Audio Converters
AU  - Legray, Francis
AU  - Heeb, Thierry
AU  - Genevey, Sebastien
AU  - Kuo, Hugo
T2  - AES Convention 133
M1  - Paper 8729
PY  - 2012
DA  - 2012/10/06
UR  - https://aes.org/publications/elibrary-page/?id=16471
PB  - Audio Engineering Society
LA  - en
AB  - Self-synchronizing converters represent an elegant and cost effective solution for audio functionality integration into SoC (System-on-Chip) as they integrate both conversion and clock synchronization functionalities. Audio performance of such converters is, however, very dependent on the jitter rejection capabilities of the synchronization system. A methodology based on two period deviation tolerance templates is described for evaluating such synchronization solutions, prior to any silicon measurements. It is also a unique way for specifying expected performance of a synchronization system in the presence of jitter on the audio interface. The proposed methodology is applied to a self-synchronizing audio converter and its advantages are illustrated by both simulation and measurement results.
ER  -