S. Laurin and K. Reichard, “Determining Manufacture Variation in Loudspeakers Through Measurement of Thiele/Small Parameters,” in Proc. AES Convention 125, Oct. 2008, Paper 7590. [Online]. Available: https://aes.org/publications/elibrary-page/?id=14741
Laurin S, Reichard K. Determining Manufacture Variation in Loudspeakers Through Measurement of Thiele/Small Parameters. In: AES Convention 125. Audio Engineering Society; 2008. Paper 7590. Available from: https://aes.org/publications/elibrary-page/?id=14741
@inproceedings{Laurin2008_14741,
author = {Laurin, Scott and Reichard, Karl},
title = {{Determining Manufacture Variation in Loudspeakers Through Measurement of Thiele/Small Parameters}},
booktitle = {AES Convention 125},
note = {Paper 7590},
year = {2008},
month = oct,
publisher = {Audio Engineering Society},
url = {https://aes.org/publications/elibrary-page/?id=14741}
}
TY - CPAPER
TI - Determining Manufacture Variation in Loudspeakers Through Measurement of Thiele/Small Parameters
AU - Laurin, Scott
AU - Reichard, Karl
T2 - AES Convention 125
M1 - Paper 7590
PY - 2008
DA - 2008/10/06
UR - https://aes.org/publications/elibrary-page/?id=14741
PB - Audio Engineering Society
LA - en
AB - Thiele/Small parameters have become a standard for characterizing loudspeakers. Using fairly straightforward methods, the Thiele/Small parameters for twenty nominally identical loudspeakers were determined. The data were compiled to determine the manufacturing variations. Manufacturing tolerances can have a large impact on the variability and quality of loudspeakers produced. Generally, when more stringent tolerances are applied, there is less variation and drivers become more expensive. Now that the loudspeakers have been characterized, each one will be driven to failure. Some loudspeakers will be intentionally degraded to accelerate failures. The goal is to correlate variation in the Thiele/Small parameters with variation in speaker failure modes and operating life.
ER -