Y. Shen, X. Wang, and Z. Wu, “Accelerated Power Test Analysis Based on Loudspeaker Life Distribution,” in Proc. AES Convention 124, May 2008, Paper 7345. [Online]. Available: https://aes.org/publications/elibrary-page/?id=14475
Shen Y, Wang X, Wu Z. Accelerated Power Test Analysis Based on Loudspeaker Life Distribution. In: AES Convention 124. Audio Engineering Society; 2008. Paper 7345. Available from: https://aes.org/publications/elibrary-page/?id=14475
@inproceedings{Shen2008_14475,
author = {Shen, Yong and Wang, Xu and Wu, Zhicheng},
title = {{Accelerated Power Test Analysis Based on Loudspeaker Life Distribution}},
booktitle = {AES Convention 124},
note = {Paper 7345},
year = {2008},
month = may,
publisher = {Audio Engineering Society},
url = {https://aes.org/publications/elibrary-page/?id=14475}
}
TY - CPAPER
TI - Accelerated Power Test Analysis Based on Loudspeaker Life Distribution
AU - Shen, Yong
AU - Wang, Xu
AU - Wu, Zhicheng
T2 - AES Convention 124
M1 - Paper 7345
PY - 2008
DA - 2008/05/06
UR - https://aes.org/publications/elibrary-page/?id=14475
PB - Audio Engineering Society
LA - en
AB - For the loudspeaker manufacturers, the long time spending on power test required by relative standards or buyers has deeply influenced the period of product design and development. The authors apply the theory of reliability to cut the duration of loudspeaker power test. On the basis of experiment data, a model of loudspeaker life distribution is propounded, from which an accelerated factor of loudspeaker power test is derived and then the characteristic of loudspeaker under normal working conditions can be estimated. The method can be used on relative power test conveniently and shorten the duration of the test effectively.
ER -