Investigations of Various Forms of Distortion Inherent in Transistor Amplifiers

Ohashi SI, Sampei T, Okuda E. Investigations of Various Forms of Distortion Inherent in Transistor Amplifiers. In: AES Convention 39. Audio Engineering Society; 1970. Paper 766. Available from: https://aes.org/publications/elibrary-page/?id=1246

@inproceedings{Ohashi1970_1246,
  author = {Ohashi, Shin-ichi and Sampei, Tohru and Okuda, Eiji},
  title = {{Investigations of Various Forms of Distortion Inherent in Transistor Amplifiers}},
  booktitle = {AES Convention 39},
  note = {Paper 766},
  year = {1970},
  month = oct,
  publisher = {Audio Engineering Society},
  url = {https://aes.org/publications/elibrary-page/?id=1246}
}

TY  - CPAPER
TI  - Investigations of Various Forms of Distortion Inherent in Transistor Amplifiers
AU  - Ohashi, Shin-ichi
AU  - Sampei, Tohru
AU  - Okuda, Eiji
T2  - AES Convention 39
M1  - Paper 766
PY  - 1970
DA  - 1970/10/06
UR  - https://aes.org/publications/elibrary-page/?id=1246
PB  - Audio Engineering Society
LA  - en
AB  - We investigated various forms of distortion inherent in transistor audio amplifiers. The effect of input voltage or current and operating point for various quiescent conditions are investigated theoretically as well as experimentally, and optimum quiescent operating conditions for low distortion design are deduced. Finally, the auditory sensitivities to each component of distortion are investigated. It can be concluded that the auditory sensitivity for music may be estimated by comparing the product of the frequency, that the instantaneous intensity of the music crosses for a given level and the auditory sensitivity for each component of distortion for pure tone, which can be measured more accurately and simply than for music.
ER  -