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Convention Paper

History and Development of the Lede Control Room Concept

Authors: Davis, Chips; Meeks, Glenn E.

AES Convention 72 · Paper 1954 · October 1982

Abstract

There is a considerable amount of controversy and misconception surrounding this relatively new control room design concept. The authors propose to outlline the original test data, obtained via TDS, which provided the formulative basis of the concept, and the subsequent developments provided through the use of the Time-Energy-Frequency test system.

Details

Published in
AES Convention 72
AES Convention
72
Paper number
1954
Publication date
October 6, 1982
Session subject
Studio Design and Technology
Affiliation
LEDE Designs, Las Vegas, NV ; E. A. Designs, Indianapolis, IN (See document for exact affiliation information.)
Type
Convention Paper