Stylus Mass and Elliptical Points

Walton J. Stylus Mass and Elliptical Points. In: AES Convention 17. Audio Engineering Society; 1965.pp. 424:1-19. Available from: https://aes.org/publications/elibrary-page/?id=1016

@inproceedings{Walton1965_1016,
  author = {Walton, John},
  title = {{Stylus Mass and Elliptical Points}},
  booktitle = {AES Convention 17},
  pages = {424:1-19},
  url = {https://aes.org/publications/elibrary-page/?id=1016},
  year = {1965},
  month = oct,
  publisher = {Audio Engineering Society}
}

TY  - CPAPER
TI  - Stylus Mass and Elliptical Points
AU  - Walton, John
T2  - AES Convention 17
SP  - 1
EP  - 19
M1  - Paper 424
PY  - 1965
DA  - 1965/10/06
UR  - https://aes.org/publications/elibrary-page/?id=1016
PB  - Audio Engineering Society
LA  - en
AB  - Elliptical points give higher measured distortion than conventional styli. An argument is put forward that this is largely due to a greater preponderance of stylus mass distortion over tracing distortion. It is claimed this theory can explain the occurrence of -modulation noise- on elliptical styli.
ER  -