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Measurement of Small Time Constants of Thermal Impedance of Bipolar Transistors with an Audio Analyzer

For the estimation and the simulation of linear and nonlinear distortions caused by thermally effected power-dependent internal feedback (TPF), the thermal impedance has to be measured. Conventional measurements refer to the time domain; they analyze the response to switched changes of power dissipation. This paper proposes measurements in the frequency domain with the advantage that an audio analyzer can be employed.

 

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16938
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