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For the estimation and the simulation of linear and nonlinear distortions caused by thermally effected power-dependent internal feedback (TPF), the thermal impedance has to be measured. Conventional measurements refer to the time domain; they analyze the response to switched changes of power dissipation. This paper proposes measurements in the frequency domain with the advantage that an audio analyzer can be employed.
Author (s): Latzel, Thomas K.;
Gottwald, Alfons J.;
Affiliation:
Institute for Communication Engineering, Neubiberg, Germany
(See document for exact affiliation information.)
AES Convention: 98
Paper Number:3968
Publication Date:
1995-02-06
Session subject:
Audio Electronics
DOI:
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Latzel, Thomas K.; Gottwald, Alfons J.; 1995; Measurement of Small Time Constants of Thermal Impedance of Bipolar Transistors with an Audio Analyzer [PDF]; Institute for Communication Engineering, Neubiberg, Germany; Paper 3968; Available from: https://aes.org/publications/elibrary-page/?id=7798
Latzel, Thomas K.; Gottwald, Alfons J.; Measurement of Small Time Constants of Thermal Impedance of Bipolar Transistors with an Audio Analyzer [PDF]; Institute for Communication Engineering, Neubiberg, Germany; Paper 3968; 1995 Available: https://aes.org/publications/elibrary-page/?id=7798
@inproceedings{Latzel1995measurement,
title={{Measurement of Small Time Constants of Thermal Impedance of Bipolar Transistors with an Audio Analyzer}},
author={Latzel, Thomas K. and Gottwald, Alfons J.},
year={1995},
month={feb},
booktitle={Journal of the Audio Engineering Society},
publisher={Paper 3968; AES Convention 98; February 1995},
number={3968},
organization={AES},
}
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