Improved Low Frequency Microphone Testing

Sander-Röttcher H, Tams K. Improved Low Frequency Microphone Testing. In: AES Convention 92. Audio Engineering Society; 1992. Paper 3234. Available from: https://aes.org/publications/elibrary-page/?id=6899

@inproceedings{SanderRottcher1992_6899,
  author = {Sander-Röttcher, Harald and Tams, Kersten},
  title = {{Improved Low Frequency Microphone Testing}},
  booktitle = {AES Convention 92},
  note = {Paper 3234},
  year = {1992},
  month = mar,
  publisher = {Audio Engineering Society},
  url = {https://aes.org/publications/elibrary-page/?id=6899}
}

TY  - CPAPER
TI  - Improved Low Frequency Microphone Testing
AU  - Sander-Röttcher, Harald
AU  - Tams, Kersten
T2  - AES Convention 92
M1  - Paper 3234
PY  - 1992
DA  - 1992/03/06
UR  - https://aes.org/publications/elibrary-page/?id=6899
PB  - Audio Engineering Society
LA  - en
AB  - Testing of directional microphones under free-field conditions at low frequencies is problematic if an anechoic chamber is used beneath its cutoff frequency. In accordance to IEC 268-T4 guided waves in a correctly terminated duct can be used to produce a plane, travelling wave at low frequencies. An active absorber system is introduced which reduces the length of the tube and improves the reflection coefficient. First measurements in a test setup are presented.
ER  -