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Testing of directional microphones under free-field conditions at low frequencies is problematic if an anechoic chamber is used beneath its cutoff frequency. In accordance to IEC 268-T4 guided waves in a correctly terminated duct can be used to produce a plane, travelling wave at low frequencies. An active absorber system is introduced which reduces the length of the tube and improves the reflection coefficient. First measurements in a test setup are presented.
Author (s): Sander-Röttcher, Harald;
Tams, Kersten;
Affiliation:
Sennheiser-electronic KG., Wedemark, Germany
(See document for exact affiliation information.)
AES Convention: 92
Paper Number:3234
Publication Date:
1992-03-06
Session subject:
Measurement, Technique, and Instrumentation
DOI:
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Sander-Röttcher, Harald; Tams, Kersten; 1992; Improved Low Frequency Microphone Testing [PDF]; Sennheiser-electronic KG., Wedemark, Germany; Paper 3234; Available from: https://aes.org/publications/elibrary-page/?id=6899
Sander-Röttcher, Harald; Tams, Kersten; Improved Low Frequency Microphone Testing [PDF]; Sennheiser-electronic KG., Wedemark, Germany; Paper 3234; 1992 Available: https://aes.org/publications/elibrary-page/?id=6899
@inproceedings{Sander-Röttcher1992improved,
title={{Improved Low Frequency Microphone Testing}},
author={Sander-Röttcher, Harald and Tams, Kersten},
year={1992},
month={mar},
booktitle={Journal of the Audio Engineering Society},
publisher={Paper 3234; AES Convention 92; March 1992},
number={3234},
organization={AES},
}
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