The Generation of Digital -Electronic Gong- Test Signals

Travis C. The Generation of Digital -Electronic Gong- Test Signals. In: AES Conference: 11th International Conference: Test & Measurement. Audio Engineering Society; 1992. Paper 11-013. Available from: https://aes.org/publications/elibrary-page/?id=6283

@inproceedings{Travis1992_6283,
  author = {Travis, Chris},
  title = {{The Generation of Digital -Electronic Gong- Test Signals}},
  booktitle = {AES Conference: 11th International Conference: Test \& Measurement},
  note = {Paper 11-013},
  year = {1992},
  month = may,
  publisher = {Audio Engineering Society},
  url = {https://aes.org/publications/elibrary-page/?id=6283}
}

TY  - CPAPER
TI  - The Generation of Digital -Electronic Gong- Test Signals
AU  - Travis, Chris
T2  - AES Conference: 11th International Conference: Test & Measurement
M1  - Paper 11-013
PY  - 1992
DA  - 1992/05/06
UR  - https://aes.org/publications/elibrary-page/?id=6283
PB  - Audio Engineering Society
LA  - en
AB  - In subjective audio assessment, the exponentially decaying sinusoid (-electronic gong-) is one of the most valuable artificial signals. This paper describes the real-time generation of digital electronic gongs that are entirely free of distortion and noise modulation. A linearized fourth-order recursive filter is used. A novel error feedforward technique makes the filter's noise floor perfectly white.
ER  -