Loudspeaker Production Testing Using the Techron TEF System 20 TDS Analyzer and Host PC

Schwing D, Keele J,DB(. Loudspeaker Production Testing Using the Techron TEF System 20 TDS Analyzer and Host PC. In: AES Conference: 11th International Conference: Test & Measurement. Audio Engineering Society; 1992. Paper 11-032. Available from: https://aes.org/publications/elibrary-page/?id=6264

@inproceedings{Schwing1992_6264,
  author = {Schwing, Donald and Keele, Jr., D. B. (Don)},
  title = {{Loudspeaker Production Testing Using the Techron TEF System 20 TDS Analyzer and Host PC}},
  booktitle = {AES Conference: 11th International Conference: Test \& Measurement},
  note = {Paper 11-032},
  year = {1992},
  month = may,
  publisher = {Audio Engineering Society},
  url = {https://aes.org/publications/elibrary-page/?id=6264}
}

TY  - CPAPER
TI  - Loudspeaker Production Testing Using the Techron TEF System 20 TDS Analyzer and Host PC
AU  - Schwing, Donald
AU  - Keele, Jr., D. B. (Don)
T2  - AES Conference: 11th International Conference: Test & Measurement
M1  - Paper 11-032
PY  - 1992
DA  - 1992/05/06
UR  - https://aes.org/publications/elibrary-page/?id=6264
PB  - Audio Engineering Society
LA  - en
AB  - A comprehensive system for doing production testing of loudspeakers and systems is described. Multiple TEF analyzers can be controlled by a single host computer to create elaborate test environments. The software allows the test engineer to orchestrate very complex test sequences while simultaneously minimizing the perceived complexity of the system as viewed by the test operator. Tests that can be incorporated in the test sequence, with pass/fail window parameters, include any or all of the following (in any order): frequency response, phase response (polarity), harmonic tracking, harmonic distortion (of specific harmonics), THD, THD and noise, spectrum analysis (FFT), and impedance. Options include the capability to completely store all the raw data from a test run for after-the-fact review and analysis.
ER  -