On the Use of Parametric Spectrum Analysis for High-Resolution, Low-Frequency, Free Field Loudspeaker Measurements

Schuck PL, Olive S, Verreault E, Bonneville M, Sally S. On the Use of Parametric Spectrum Analysis for High-Resolution, Low-Frequency, Free Field Loudspeaker Measurements. In: AES Conference: 11th International Conference: Test & Measurement. Audio Engineering Society; 1992. Paper 11-039. Available from: https://aes.org/publications/elibrary-page/?id=6257

@inproceedings{Schuck1992_6257,
  author = {Schuck, Peter L. and Olive, Sean and Verreault, E. and Bonneville, M. and Sally, S.},
  title = {{On the Use of Parametric Spectrum Analysis for High-Resolution, Low-Frequency, Free Field Loudspeaker Measurements}},
  booktitle = {AES Conference: 11th International Conference: Test \& Measurement},
  note = {Paper 11-039},
  year = {1992},
  month = may,
  publisher = {Audio Engineering Society},
  url = {https://aes.org/publications/elibrary-page/?id=6257}
}

TY  - CPAPER
TI  - On the Use of Parametric Spectrum Analysis for High-Resolution, Low-Frequency, Free Field Loudspeaker Measurements
AU  - Schuck, Peter L.
AU  - Olive, Sean
AU  - Verreault, E.
AU  - Bonneville, M.
AU  - Sally, S.
T2  - AES Conference: 11th International Conference: Test & Measurement
M1  - Paper 11-039
PY  - 1992
DA  - 1992/05/06
UR  - https://aes.org/publications/elibrary-page/?id=6257
PB  - Audio Engineering Society
LA  - en
AB  - When using traditional non-parametric DFT methods,long reflection free acoustic impulse response measurements are required to accurately calculate the low frequency free field frequency response of a loudspeaker. It is shown that by combining parametric input impedance and acoustic impulse response models the associated parameters can be estimated from short data records yielding high resolution low frequency free-field frequency response measurements.
ER  -