M. D. Ewy and K. M. Jones, “New Technologies Allow Comprehensive and Rapid Tape Recorder Testing,” in Proc. AES Convention 66, May 1980, pp. 1630:1-10. [Online]. Available: https://aes.org/publications/elibrary-page/?id=3745
Ewy MD, Jones KM. New Technologies Allow Comprehensive and Rapid Tape Recorder Testing. In: AES Convention 66. Audio Engineering Society; 1980.pp. 1630:1-10. Available from: https://aes.org/publications/elibrary-page/?id=3745
@inproceedings{Ewy1980_3745,
author = {Ewy, M. Dale and Jones, Kenneth M.},
title = {{New Technologies Allow Comprehensive and Rapid Tape Recorder Testing}},
booktitle = {AES Convention 66},
pages = {1630:1-10},
url = {https://aes.org/publications/elibrary-page/?id=3745},
year = {1980},
month = may,
publisher = {Audio Engineering Society}
}
TY - CPAPER
TI - New Technologies Allow Comprehensive and Rapid Tape Recorder Testing
AU - Ewy, M. Dale
AU - Jones, Kenneth M.
T2 - AES Convention 66
SP - 1
EP - 10
M1 - Paper 1630
PY - 1980
DA - 1980/05/06
UR - https://aes.org/publications/elibrary-page/?id=3745
PB - Audio Engineering Society
LA - en
AB - Integrated circuit, microprocessor, and video display technologies have been combined to provide a comprehensive magnetic tape recorder test capability in a bench top instrument. It is now possible to do a thorough performance analysis on a recorder in a few minutes. Instruments like this should lead to significant advances in the recording field.
ER -