Measuring and Evaluating Excess Noise in Resistors

LaMacchia B, Swanson B. Measuring and Evaluating Excess Noise in Resistors. In: AES Convention 145. Audio Engineering Society; 2018. Paper 486. Available from: https://aes.org/publications/elibrary-page/?id=19750

@inproceedings{LaMacchia2018_19750,
  author = {LaMacchia, Brewster and Swanson, Bradford},
  title = {{Measuring and Evaluating Excess Noise in Resistors}},
  booktitle = {AES Convention 145},
  note = {Paper 486},
  year = {2018},
  month = oct,
  publisher = {Audio Engineering Society},
  url = {https://aes.org/publications/elibrary-page/?id=19750}
}

TY  - CPAPER
TI  - Measuring and Evaluating Excess Noise in Resistors
AU  - LaMacchia, Brewster
AU  - Swanson, Bradford
T2  - AES Convention 145
M1  - Paper 486
PY  - 2018
DA  - 2018/10/06
UR  - https://aes.org/publications/elibrary-page/?id=19750
PB  - Audio Engineering Society
LA  - en
AB  - All resistors generate white (Johnson-Nysquist) noise based on their value and temperature; they can also generate several other types of (excess) noise. The amount or characteristics of a resistor’s excess noise could be one factor contributing to variations in perceived sound quality. This research explores methods for measuring the Johnson-Nysquist and excess noise of different resistors with the hopes of quantifying the performance of the components under test. A methodology is proposed for evaluating the audibility of both Johnson-Nysquist and excess noise that requires no special measurement equipment, only a sound system with suitable computer and freely available software.
ER  -