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This paper describes a proposed test method that allows both the continuous and short-term maximum peak output and SPL for electronic and electroacoustic systems to be measured. Systems such as power amplifiers, loudspeakers, and sound reinforcement/cinema systems can be measured and specified over the complete audible range. The test is divided into two parts that individually assesses: (1) the system’s broadband continuous maximum output using various steady-state low-crest-factor test signals and (2) the system’s short-term narrow-band maximum output using high-crest-factor test signals. The combination of both tests completely specifies the system’s maximum output on a continuous and short-term narrow-band basis. A future Part 2 paper will go into detail concerning the tests and will illustrate with measured test results.
Author (s): Keele, Jr., D. B. (Don);
Hutt, Steven;
Kay, Marshall;
Sarvis, Hugh;
Affiliation:
DBK Associates and Labs, Bloomington, IN, USA; Equity Sound Investments, Bloomington, IN, USA; Keysight Technologies, Apex, NC, USA; Presonus Audio Electronics-Worx Audio Technologies, Baton Rouge, LA, USA
(See document for exact affiliation information.)
AES Convention: 144
Paper Number:427
Publication Date:
2018-05-06
Session subject:
Signal Processing/Audio Effects & Instrumentation/Measurements/Forensics
DOI:
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Keele, Jr., D. B. (Don); Hutt, Steven; Kay, Marshall; Sarvis, Hugh; 2018; Proposed AES Test Standard for Specifying Continuous and Short-Term Maximum Power and SPL for Electronic and Electro-Acoustic Systems: Part 1 [PDF]; DBK Associates and Labs, Bloomington, IN, USA; Equity Sound Investments, Bloomington, IN, USA; Keysight Technologies, Apex, NC, USA; Presonus Audio Electronics-Worx Audio Technologies, Baton Rouge, LA, USA; Paper 427; Available from: https://aes.org/publications/elibrary-page/?id=19540
Keele, Jr., D. B. (Don); Hutt, Steven; Kay, Marshall; Sarvis, Hugh; Proposed AES Test Standard for Specifying Continuous and Short-Term Maximum Power and SPL for Electronic and Electro-Acoustic Systems: Part 1 [PDF]; DBK Associates and Labs, Bloomington, IN, USA; Equity Sound Investments, Bloomington, IN, USA; Keysight Technologies, Apex, NC, USA; Presonus Audio Electronics-Worx Audio Technologies, Baton Rouge, LA, USA; Paper 427; 2018 Available: https://aes.org/publications/elibrary-page/?id=19540
@inproceedings{Keele2018proposed,
title={{Proposed AES Test Standard for Specifying Continuous and Short-Term Maximum Power and SPL for Electronic and Electro-Acoustic Systems: Part 1}},
author={Keele, Jr., D. B. (Don) and Hutt, Steven and Kay, Marshall and Sarvis, Hugh},
year={2018},
month={may},
booktitle={Journal of the Audio Engineering Society},
publisher={Engineering Brief 427; AES Convention 144; May 2018},
number={427},
organization={AES},
}
TY – paper
TI – Proposed AES Test Standard for Specifying Continuous and Short-Term Maximum Power and SPL for Electronic and Electro-Acoustic Systems: Part 1
AU – Keele, Jr., D. B. (Don)
AU – Hutt, Steven
AU – Kay, Marshall
AU – Sarvis, Hugh
PY – 2018
JO – Journal of the Audio Engineering Society
VL – 427
Y1 – May 2018
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