N. Tsunoda, T. Hara, and K. Nageno, “A Headphone Measurement System Covers both Audible Frequency and beyond 20 kHz (Part 2),” in Proc. AES Convention 140, May 2016, Paper 9530. [Online]. Available: https://aes.org/publications/elibrary-page/?id=18229
Tsunoda N, Hara T, Nageno K. A Headphone Measurement System Covers both Audible Frequency and beyond 20 kHz (Part 2). In: AES Convention 140. Audio Engineering Society; 2016. Paper 9530. Available from: https://aes.org/publications/elibrary-page/?id=18229
@inproceedings{Tsunoda2016_18229,
author = {Tsunoda, Naotaka and Hara, Takeshi and Nageno, Koji},
title = {{A Headphone Measurement System Covers both Audible Frequency and beyond 20 kHz (Part 2)}},
booktitle = {AES Convention 140},
note = {Paper 9530},
year = {2016},
month = may,
publisher = {Audio Engineering Society},
url = {https://aes.org/publications/elibrary-page/?id=18229}
}
TY - CPAPER
TI - A Headphone Measurement System Covers both Audible Frequency and beyond 20 kHz (Part 2)
AU - Tsunoda, Naotaka
AU - Hara, Takeshi
AU - Nageno, Koji
T2 - AES Convention 140
M1 - Paper 9530
PY - 2016
DA - 2016/05/06
UR - https://aes.org/publications/elibrary-page/?id=18229
PB - Audio Engineering Society
LA - en
AB - A new scheme consists of measurement by wide range HATS, and the free-field HRTF correction was proposed to enable entire frequency response measurement from audible frequency and higher frequency area up to 140 kHz and for direct comparison with free field loud speaker frequency response. This report supplements the previous report [N. Tsunoda et al., “A Headphone Measurement System for Audible Frequency and Beyond 20kHz,” AES Convention 139, October 2015, convention paper 9375] that described system concept by adding ear simulator detail and tips to obtain reliable data with much improved reproducibility.
ER -