E. Enzinger, “Characterizing Formant Tracks in Viennese Diphthongs for Forensic Speaker Comparison,” in Proc. AES Conference: 39th International Conference: Audio Forensics: Practices and Challenges, Jun. 2010, Paper 2-2. [Online]. Available: https://aes.org/publications/elibrary-page/?id=15488
Enzinger E. Characterizing Formant Tracks in Viennese Diphthongs for Forensic Speaker Comparison. In: AES Conference: 39th International Conference: Audio Forensics: Practices and Challenges. Audio Engineering Society; 2010. Paper 2-2. Available from: https://aes.org/publications/elibrary-page/?id=15488
@inproceedings{Enzinger2010_15488,
author = {Enzinger, Ewald},
title = {{Characterizing Formant Tracks in Viennese Diphthongs for Forensic Speaker Comparison}},
booktitle = {AES Conference: 39th International Conference: Audio Forensics: Practices and Challenges},
note = {Paper 2-2},
year = {2010},
month = jun,
publisher = {Audio Engineering Society},
url = {https://aes.org/publications/elibrary-page/?id=15488}
}
TY - CPAPER
TI - Characterizing Formant Tracks in Viennese Diphthongs for Forensic Speaker Comparison
AU - Enzinger, Ewald
T2 - AES Conference: 39th International Conference: Audio Forensics: Practices and Challenges
M1 - Paper 2-2
PY - 2010
DA - 2010/06/06
UR - https://aes.org/publications/elibrary-page/?id=15488
PB - Audio Engineering Society
LA - en
AB - This study evaluates methods that capture time-dynamic properties of diphthongs produced by speakers of Viennese German for application in a forensic setting. Polynomials, discrete cosine transform and B-splines along with experimental features based on bent-cable regression models were used to characterise the first three formant tracks of two /aE/ diphthong segments. The resulting coefficients were in turn used as parameters in a speaker discrimination procedure based on likelihood ratios which were calculated using a multi-variate kernel density formula (MVKD). A comparison of the achieved performance based on cross-validation is presented in terms of equal error rate (EER) and the log-likelihood ratio cost metric as well as DET plots.
ER -