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Convention Paper

FET Temperature Characteristics

Authors: Sinclair, John C.

AES Convention 34 · Paper 557 · April 1968

Abstract

Before designing to stabilize circuit drift due to changing temperatures it is helpful and sometimes necessary to understand and explain the physics of the observed drifts. In the case of the Junction Gate FET this enables minimizing of temperature effects using the characteristics of the device itself. It is the purpose of this paper to outline FET temperature characteristics.

Details

Published in
AES Convention 34
AES Convention
34
Paper number
557
Publication date
April 6, 1968
Affiliation
Zenith Radio Corporation, Chicago, IL (See document for exact affiliation information.)
Type
Convention Paper