The Scanning Electron Microscope-A New Tool in Disc-Recording Research

Woodward JG, Coutts MD, Levin ER. The Scanning Electron Microscope-A New Tool in Disc-Recording Research. In: AES Convention 34. Audio Engineering Society; 1968. Paper 569. Available from: https://aes.org/publications/elibrary-page/?id=1441

@inproceedings{Woodward1968_1441,
  author = {Woodward, J. G. and Coutts, M. D. and Levin, E. R.},
  title = {{The Scanning Electron Microscope-A New Tool in Disc-Recording Research}},
  booktitle = {AES Convention 34},
  note = {Paper 569},
  year = {1968},
  month = apr,
  publisher = {Audio Engineering Society},
  url = {https://aes.org/publications/elibrary-page/?id=1441}
}

TY  - CPAPER
TI  - The Scanning Electron Microscope-A New Tool in Disc-Recording Research
AU  - Woodward, J. G.
AU  - Coutts, M. D.
AU  - Levin, E. R.
T2  - AES Convention 34
M1  - Paper 569
PY  - 1968
DA  - 1968/04/06
UR  - https://aes.org/publications/elibrary-page/?id=1441
PB  - Audio Engineering Society
LA  - en
AB  - The scanning electron microscope (SEM) has only recently become generally available as a commercial device. The combination of high resolution and high magnification with a remarkable depth of focus provided by the SEM, together with simple procedures in specimen preparation, make this instrument admirably suited for use in disc-recording research and development. A description of the SEM is given, and photomicrographs of details of recording and playback styli and of new and worn groove walls in records are shown.
ER  -