Investigation on the Related Effect Caused by ECM Miniaturization

Hu Z, Lee J, Wu Z, Zhang T. Investigation on the Related Effect Caused by ECM Miniaturization. In: AES Convention 119. Audio Engineering Society; 2005. Paper 6612. Available from: https://aes.org/publications/elibrary-page/?id=13286

@inproceedings{Hu2005_13286,
  author = {Hu, Zongbao and Lee, Jun and Wu, Zonghan and Zhang, Tao},
  title = {{Investigation on the Related Effect Caused by ECM Miniaturization}},
  booktitle = {AES Convention 119},
  note = {Paper 6612},
  year = {2005},
  month = oct,
  publisher = {Audio Engineering Society},
  url = {https://aes.org/publications/elibrary-page/?id=13286}
}

TY  - CPAPER
TI  - Investigation on the Related Effect Caused by ECM Miniaturization
AU  - Hu, Zongbao
AU  - Lee, Jun
AU  - Wu, Zonghan
AU  - Zhang, Tao
T2  - AES Convention 119
M1  - Paper 6612
PY  - 2005
DA  - 2005/10/06
UR  - https://aes.org/publications/elibrary-page/?id=13286
PB  - Audio Engineering Society
LA  - en
AB  - Miniaturization is a very important issue that people must concern during design and production of the electronic components. The miniaturization of ECM (electret condenser microphone) needs the corresponding changes of ECM structure, dimensions, and circuit distribution. Such changes impact on the specifications of ECM. This paper makes discussions on the related effect of ECM miniaturization, which is useful for the design of mini-microphones.
ER  -