Loose Particle Detection in Loudspeakers

Temme S, Brunet P, Chakroff E. Loose Particle Detection in Loudspeakers. In: AES Convention 115. Audio Engineering Society; 2003. Paper 5883. Available from: https://aes.org/publications/elibrary-page/?id=12407

@inproceedings{Temme2003_12407,
  author = {Temme, Steve and Brunet, Pascal and Chakroff, Evan},
  title = {{Loose Particle Detection in Loudspeakers}},
  booktitle = {AES Convention 115},
  note = {Paper 5883},
  year = {2003},
  month = oct,
  publisher = {Audio Engineering Society},
  url = {https://aes.org/publications/elibrary-page/?id=12407}
}

TY  - CPAPER
TI  - Loose Particle Detection in Loudspeakers
AU  - Temme, Steve
AU  - Brunet, Pascal
AU  - Chakroff, Evan
T2  - AES Convention 115
M1  - Paper 5883
PY  - 2003
DA  - 2003/10/06
UR  - https://aes.org/publications/elibrary-page/?id=12407
PB  - Audio Engineering Society
LA  - en
AB  - During the loudspeaker manufacturing process, particles may become trapped inside the loudspeaker, resulting in a distinctive defect that is easily heard but difficult to measure. To give a clearer view of the problem, Time-Frequency maps are shown for some defective loudspeakers. Based on this analysis, a reliable testing procedure using a swept-sine stimulus, high-pass filter, and RMS-envelope analysis is presented. Further possible enhancements and applications of the method are listed.
ER  -