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The fluctuation of the idle current resulting from temperature increases of power transistors in class-B amplifiers becomes the cause of transient crossover distortion when dynamic input signals such as music sources are applied. This paper explains the cause of this transient crossover distortion and suggests a counter-measure using a bias control circuit with a built-in microprocessor.
Author (s): Sato, T.;
Higashiyama, K.;
Jiko, H.;
Affiliation:
Matsushita Electric Industrial Co., Ltd., Osaka, Japan
(See document for exact affiliation information.)
AES Convention: 72
Paper Number:1896
Publication Date:
1982-10-06
Session subject:
Signal Processing and Amplification
DOI:
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Sato, T.; Higashiyama, K.; Jiko, H.; 1982; Amplifier Transient Crossover Distortion Resulting from Temperature Change of Output Power Transistors [PDF]; Matsushita Electric Industrial Co., Ltd., Osaka, Japan; Paper 1896; Available from: https://aes.org/publications/elibrary-page/?id=11860
Sato, T.; Higashiyama, K.; Jiko, H.; Amplifier Transient Crossover Distortion Resulting from Temperature Change of Output Power Transistors [PDF]; Matsushita Electric Industrial Co., Ltd., Osaka, Japan; Paper 1896; 1982 Available: https://aes.org/publications/elibrary-page/?id=11860
@inproceedings{Sato1982amplifier,
title={{Amplifier Transient Crossover Distortion Resulting from Temperature Change of Output Power Transistors}},
author={Sato, T. and Higashiyama, K. and Jiko, H.},
year={1982},
month={oct},
booktitle={Journal of the Audio Engineering Society},
publisher={Paper 1896; AES Convention 72; October 1982},
number={1896},
organization={AES},
}
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