Amplifier Transient Crossover Distortion Resulting from Temperature Change of Output Power Transistors

Sato T, Higashiyama K, Jiko H. Amplifier Transient Crossover Distortion Resulting from Temperature Change of Output Power Transistors. In: AES Convention 72. Audio Engineering Society; 1982. Paper 1896. Available from: https://aes.org/publications/elibrary-page/?id=11860

@inproceedings{Sato1982_11860,
  author = {Sato, T. and Higashiyama, K. and Jiko, H.},
  title = {{Amplifier Transient Crossover Distortion Resulting from Temperature Change of Output Power Transistors}},
  booktitle = {AES Convention 72},
  note = {Paper 1896},
  year = {1982},
  month = oct,
  publisher = {Audio Engineering Society},
  url = {https://aes.org/publications/elibrary-page/?id=11860}
}

TY  - CPAPER
TI  - Amplifier Transient Crossover Distortion Resulting from Temperature Change of Output Power Transistors
AU  - Sato, T.
AU  - Higashiyama, K.
AU  - Jiko, H.
T2  - AES Convention 72
M1  - Paper 1896
PY  - 1982
DA  - 1982/10/06
UR  - https://aes.org/publications/elibrary-page/?id=11860
PB  - Audio Engineering Society
LA  - en
AB  - The fluctuation of the idle current resulting from temperature increases of power transistors in class-B amplifiers becomes the cause of transient crossover distortion when dynamic input signals such as music sources are applied. This paper explains the cause of this transient crossover distortion and suggests a counter-measure using a bias control circuit with a built-in microprocessor.
ER  -