Measurement of Sampling Jitter in Analog-to-Digital and Digital-to-Analog Converters Using Analytic Signals

Nishimura A, Koizumi N. Measurement of Sampling Jitter in Analog-to-Digital and Digital-to-Analog Converters Using Analytic Signals. In: AES Convention 112. Audio Engineering Society; 2002. Paper 5586. Available from: https://aes.org/publications/elibrary-page/?id=11434

@inproceedings{Nishimura2002_11434,
  author = {Nishimura, Akira and Koizumi, Nobuo},
  title = {{Measurement of Sampling Jitter in Analog-to-Digital and Digital-to-Analog Converters Using Analytic Signals}},
  booktitle = {AES Convention 112},
  note = {Paper 5586},
  year = {2002},
  month = apr,
  publisher = {Audio Engineering Society},
  url = {https://aes.org/publications/elibrary-page/?id=11434}
}

TY  - CPAPER
TI  - Measurement of Sampling Jitter in Analog-to-Digital and Digital-to-Analog Converters Using Analytic Signals
AU  - Nishimura, Akira
AU  - Koizumi, Nobuo
T2  - AES Convention 112
M1  - Paper 5586
PY  - 2002
DA  - 2002/04/06
UR  - https://aes.org/publications/elibrary-page/?id=11434
PB  - Audio Engineering Society
LA  - en
AB  - A method of sampling jitter measurement based on time-domain analytic signals is proposed. Computer simulations and measurements were performed in order to compare the proposed method to the conventional method, in which jitter is evaluated based on amplitudes of sideband spectra for observed signals in the frequency-domain. The results show that the proposed method is effective in that this method: 1) provides good temporal resolution as a result of the direct derivation of jitter waveform, 2) achieves higher precision in measurement of jitter amplitude, and 3) can separate sidebands that originated in sampling jitter from sidebands caused by amplitude fluctuations, while observing the power spectra, because both amplitude fluctuation waveform and jitter waveform can be derived from analytic signals.
ER  -