Noise Shaping in Digital Test-Signal Generation

Semyonov EV, Lipshitz SP, Vanderkooy J. Noise Shaping in Digital Test-Signal Generation. In: AES Convention 113. Audio Engineering Society; 2002. Paper 5664. Available from: https://aes.org/publications/elibrary-page/?id=11230

@inproceedings{Semyonov2002_11230,
  author = {Semyonov, Edward V. and Lipshitz, Stanley P. and Vanderkooy, John},
  title = {{Noise Shaping in Digital Test-Signal Generation}},
  booktitle = {AES Convention 113},
  note = {Paper 5664},
  year = {2002},
  month = oct,
  publisher = {Audio Engineering Society},
  url = {https://aes.org/publications/elibrary-page/?id=11230}
}

TY  - CPAPER
TI  - Noise Shaping in Digital Test-Signal Generation
AU  - Semyonov, Edward V.
AU  - Lipshitz, Stanley P.
AU  - Vanderkooy, John
T2  - AES Convention 113
M1  - Paper 5664
PY  - 2002
DA  - 2002/10/06
UR  - https://aes.org/publications/elibrary-page/?id=11230
PB  - Audio Engineering Society
LA  - en
AB  - We extend an idea, proposed in an earlier paper, to use noise-shaping techniques in the generation of digital test signals. The previous paper proposed using noise shaping around an undithered quantizer to generate sinusoidal digital test signals with spectra having error nulls at the harmonics of the signal frequency, thus making digital distortion measurements of very great dynamic range possible. We extend this idea in a number of ways. We show: (a) that dither is necessary in order to suppress spurious artifacts caused by the nonlinearity of an undithered noise shaper, (b) that wider and deeper nulls at the harmonic frequencies can be achieved by using higher-order noise-shaper designs, (c) that IIR filter designs can moderate the increased noise power that accompanies an increased FIR filter order, and (d) some other novel uses of noise shaping in digital signal generation.
ER  -