Heusdens, Richard; Jensen, Jesper; Kleijn, W. Bastiaan; Kot, Valery; Niamut, Omar A.; Van De Par, Steven; Van Schijndel, Micholle H.
Delft University of Technology, Delft, The Netherlands; Royal Institute of Technology, Stockholm, Sweden; Philips Research Laboratories, Eindhoven, The Netherlands
March 2006
Journal Article
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