Heusdens, Richard; Jensen, Jesper; Kleijn, W. Bastiaan; Kot, Valery; Niamut, Omar A.; Van De Par, Steven; Van Schijndel, Micholle H.
Delft University of Technology, Delft, The Netherlands; Royal Institute of Technology, Stockholm, Sweden; Philips Research Laboratories, Eindhoven, The Netherlands
March 2006
Journal Article
Free to AES members & instutions and $33 to non-members
Schijndel, Nicolle H. van; Bensa, Julien; Christensen, Mads G.; Colomes, Catherine; Edler, Bernd; Heusdens, Richard; Jensen, Jesper; Jensen, Søren Holdt; Kleijn, W. Bastiaan; Kot, Valery; Kövesi, Balázs; Lindblom, Jonas; Massaloux, Dominique; Niamut, Omar A.; Nordén, Fredrik; Plasberg, Jan H.; Vafin, Renat; Par, Steven van de; Virette, David; Wübbolt, Oliver
Philips Research Laboratories, Digital Signal Processing Group, 5656 AE Eindhoven, The Netherlands; France Telecom / Orange Research Laboratories, F-22307 Lannion, France; Aalborg University, Department of Electronic Systems, DK-9220 Aalborg, Denmark; University of Hannover, Laboratorium fur Informationstechnologie, D-30167 Hannover, Germany; Delft University of Technology, Department of Mediamatics, 2628 CD Delft, The Netherlands; KTH ( Royal Institute of Technology ), School of Electrical Engineering, SE10044 Stockholm, Sweden
November 2008
Journal Article
Free to AES members & instutions and $33 to non-members
