Authors - AES

How to Graph Distortion Measurements

Authors: Temme, Steve F.

Affiliation: Bruel & Kjaer, Naerum, Denmark

Publication Date: March 1993

Type: Convention Paper

Cost: Free to AES members & institutions and $33 to non-members

Authors: Temme, Steve F.

Affiliation: Listen, Inc., Boston, MA, USA

Publication Date: August 2019

Type: Conference Paper

Cost: Free to AES members & institutions and $33 to non-members

Authors: Temme, Steve F.

Affiliation: LISTEN, Inc, Boston, MA

Publication Date: September 1998

Type: Convention Paper

Cost: Free to AES members & institutions and $33 to non-members

Authors: Struck, Christopher J.; Temme, Steve F.

Affiliation: Bruel & Kjaer, Naerum, Denmark

Publication Date: October 1992

Type: Convention Paper

Cost: Free to AES members & institutions and $33 to non-members

Authors: Struck, Christopher J.; Temme, Steve F.

Affiliation: Bruel & Kjaer, Naerum, Denmark

Publication Date: June 1994

Type: Journal Article

Cost: Free to AES members & institutions and $33 to non-members