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A Microprocessor Based TEF Analyzer

Authors: Stanley, Gerald R.
Affiliation: Crown International, Elkhart, IN
Publication Date: October 1982
Type: Convention Paper
Cost: Free to AES members & institutions and $33 to non-members

Functional Protection of High-Power Amplifiers

Authors: Scholfield, Max; Stanley, Gerald R.
Affiliation: Crown International, Elkhart, IN
Publication Date: October 1970
Type: Convention Paper
Cost: Free to AES members & institutions and $33 to non-members

What's Watt in Amplifier Testing

Authors: Stanley, Gerald R.; McLaughlin, Robert D.
Affiliation: Crown International, Elkhart, IN
Publication Date: May 1974
Type: Convention Paper
Cost: Free to AES members & institutions and $33 to non-members